Dislocation based Plasticity

P7 - Experimental Characterization of Micro Plasticity and Dislocation Microstructure

Novel experimental setups for small scale mechanical testing in combination with detailed microscopic and diffraction analysis have been established and provide a reliable basis for the identification of material parameters and validation for the different simulation approaches in P1 (Böhlke), P2 (Sandfeld) and P5 (Weygand). In addition the experimental data is used for statistical analysis within P6 (Zaiser). Preferably simple sample geometries and well-defined microstructures will be investigated. The experiments comprise compression and bending tests of single crystalline microsamples, torsion experiments on coarse grained microwires and tensile tests on epitaxial thin films on compliant polyimide substrates. In situ SEM/EBSD and Synchrotron X-ray Microdiffraction experiments will be performed to investigate the evolution of local strain fields and dislocation microstructure with high spatial resolution during loading and unloading of the samples.

Continuum Dislocation Dynamics

(a) Experimental setup at the ANKA MPI-MF beamline for in situ experiments. The total strain of the sample is measured with a laser extensometer and the Laue diffraction patterns are recorded by a large-area CCD camera. (b) Exemplary Laue diffraction pattern of a 160 nm thick Au film.

Members :
Dr. rer. nat Patric A. Gruber Institute for Applied Materials, KIT
Dipl. Ing. Mark Wobrock, Institute: Institute for Applied Materials, KIT
Dipl. Phys. Michael Ziemann, Institute: Institute for Applied Materials, KIT
Prof. Dr. rer. nat. Oliver Kraft, Institute: Institute for Applied Materials, KIT
M. sc. Alexander Görtz, Institute: Institute for Applied Materials, KIT